Research Article

Growth of Cu2ZnSnS4 Thin Films Using Moderate Annealing Temperature and Short Dwell Time

Volume: 40 Number: 3 September 30, 2019
EN TR

Growth of Cu2ZnSnS4 Thin Films Using Moderate Annealing Temperature and Short Dwell Time

Abstract

In this study CZTS thin films were fabricated by a two-stage process that sputter deposition of metallic Cu, Zn, and Sn on Mo coated glass substrates and annealing process at 500 °C using various short dwell times (4, 8, and 12 min) using Rapid Thermal Processing (RTP) approach. The X-ray diffraction (XRD), Raman spectroscopy, Scanning Electron Microscopy (SEM), Energy Dispersive X-ray Spectroscopy (EDX), and photoluminescence were employed to characterize the CZTS samples synthesized employing different sulfurization times. It was observed that all CZTS thin films showed Cu-poor and Zn-rich composition according to EDX results. XRD patterns displayed formation of kesterite CZTS and CuS secondary phases. Raman spectra of the films justified formation of kesterite CZTS phase for all CZTS thin films and formation of CTS phase, which is difficult to distinguish by XRD pattern of the films for CZTS-8 and CZTS-12 samples. SEM images of the films displayed dense, void-free, and inhomogeneous surface structure regardless of the sulfurization time. The optical band gap of the films as determined by photoluminescence was found to be about 1.36-1.37 eV.

Keywords

References

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Details

Primary Language

English

Subjects

-

Journal Section

Research Article

Publication Date

September 30, 2019

Submission Date

February 14, 2019

Acceptance Date

April 19, 2019

Published in Issue

Year 2019 Volume: 40 Number: 3

APA
Olğar, M. A., & Seyhan, A. (2019). Growth of Cu2ZnSnS4 Thin Films Using Moderate Annealing Temperature and Short Dwell Time. Cumhuriyet Science Journal, 40(3), 554-562. https://doi.org/10.17776/csj.527260

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